Bit pattern dependent effect reduction in all-optical 3R regeneration

Glesk, I. and Wang, B.C and Xu, L. and Zhou, Dujin and Runser, Robert J. and Prucnal, P.R. (2001) Bit pattern dependent effect reduction in all-optical 3R regeneration. In: 3rd Electronic Circuits and Systems Conference, 2001-09-05 - 2001-09-07.

Abstract

This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

ORCID iDs

Glesk, I. ORCID: https://orcid.org/0000-0002-3176-8069

• Share and Export
  

  BibTeXRDF+XMLMPEG-21 DIDLJSONRDF+N3METSSimple MetadataRefWorksRIS (EndNote Online, Zotero, Ref manager, etc)OpenURL ContextObjectData Cite XMLReferMODSEndNoteAtomRIOXX2 XMLRDF+N-TriplesOpenURL ContextObject in SpanASCII CitationDublin CoreEP3 XMLHTML CitationMultiline CSV
• Item metadata

  Item type:	Conference or Workshop Item(Paper)
  ID code:	37595
  Dates:	Date Event September 2001 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	11 Feb 2012 05:21
  Last modified:	12 Mar 2025 03:49
  URI:	https://strathprints.strath.ac.uk/id/eprint/37595