Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Pincik, E. and Kobayashi, H. and Jurecka, S. and Jergel, M. and Gleskova, H. and Takahashi, M. and Brunner, R. and Fujiwara, N. and Mullerova, J.; Chu, J. and Lai, Z. and Wang, L. and Xu, S., eds. (2004) Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Proccedings of the fifth international conference on thin film physics and applications. SPIE--The International Society for Optical Engineering., CHN, pp. 481-488. ISBN 9780819457554

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Abstract

This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

ORCID iDs

Pincik, E., Kobayashi, H., Jurecka, S., Jergel, M., Gleskova, H. ORCID: https://orcid.org/0000-0001-7195-9639, Takahashi, M., Brunner, R., Fujiwara, N. and Mullerova, J.; Chu, J., Lai, Z., Wang, L. and Xu, S.

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• Item metadata

  Item type:	Book Section
  ID code:	33449
  Dates:	Date Event 2004 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	20 Jan 2012 09:48
  Last modified:	11 Nov 2024 14:44
  URI:	https://strathprints.strath.ac.uk/id/eprint/33449