Electrical stability of a-Si:H TFTs fabricated at 150ºC
Gleskova, Helena and Wagner, S.; Stutzmann, M. and Boyce, J. B. and Cohen, J. D. and Collins, R. W. and Hanna, J., eds. (2001) Electrical stability of a-Si:H TFTs fabricated at 150ºC. In: Amorphous and heterogeneous silicon-based films – 2001. MRS Symposium Proceedings, 664 . Materials Research Society, USA, A19.7.1-A19.7.6. ISBN 9781558996007
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This chapter looks at electrical stability of a-Si:H TFTs fabricated at 150ºC
ORCID iDs
Gleskova, Helena ORCID: https://orcid.org/0000-0001-7195-9639 and Wagner, S.; Stutzmann, M., Boyce, J. B., Cohen, J. D., Collins, R. W. and Hanna, J.-
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Item type: Book Section ID code: 33430 Dates: DateEvent15 October 2001PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 04 Nov 2011 14:56 Last modified: 11 Nov 2024 14:44 URI: https://strathprints.strath.ac.uk/id/eprint/33430
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