Stress distribution of GaN layer grown on micro-pillar patterned GaN templates

Nagarajan, S. and Svensk, O. and Ali, M. and Naresh-Kumar, G. and Trager-Cowan, Carol and Suihkonen, S. and Sopanen, M. and Lipsanen, H. (2013) Stress distribution of GaN layer grown on micro-pillar patterned GaN templates. Applied Physics Letters, 103 (1). 012102. ISSN 0003-6951 (https://doi.org/10.1063/1.4813077)

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Abstract

High-resolution Raman mapping of the stress distribution in an etched GaN micro-pillar template and a 5 μm thick GaN layer grown on a micro-pillar patterned GaN template is investigated. Raman mapping of the E2 (high) phonon shows differences in stress between the coalescing boundary, the top surface of the pillar region and around the GaN micro-pillar. Increased compressive stress is observed at the coalescing boundary of two adjacent GaN micro-pillars, when compared to the laterally grown GaN regions. The electron channeling contrast image reveals the reduction of threading dislocation density in the GaN layer grown on the micro-pillar patterned GaN template.

ORCID iDs

Nagarajan, S., Svensk, O., Ali, M., Naresh-Kumar, G. ORCID logoORCID: https://orcid.org/0000-0002-9642-8137, Trager-Cowan, Carol ORCID logoORCID: https://orcid.org/0000-0001-8684-7410, Suihkonen, S., Sopanen, M. and Lipsanen, H.;
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