Quigley, J.L. and Bedford, T.J. and Walls, L.A. (2009) Empirical bayes estimates of development reliability for one shot devices. Safety and Reliability : the journal of the Safety and Reliability Society, 29 (4). pp. 35-46. ISSN 0961-7353
Full text not available in this repository. (Request a copy from the Strathclyde author)Abstract
This article focuses on the development reliability associated with one shot devices.
| Item type: | Article |
|---|---|
| ID code: | 15454 |
| Keywords: | empirical bayes, fault tree, reliability, one-shot device, Risk Management |
| Subjects: | Social Sciences > Industries. Land use. Labor > Risk Management |
| Department: | Strathclyde Business School > Management Science |
| Related URLs: | |
| Depositing user: | Mrs Caroline Sisi |
| Date Deposited: | 11 Feb 2010 16:42 |
| Last modified: | 04 Oct 2012 12:48 |
| URI: | http://strathprints.strath.ac.uk/id/eprint/15454 |
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