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Empirical bayes estimates of development reliability for one shot devices

Quigley, J.L. and Bedford, T.J. and Walls, L.A. (2009) Empirical bayes estimates of development reliability for one shot devices. Safety and Reliability : the journal of the Safety and Reliability Society, 29 (4). pp. 35-46. ISSN 0961-7353

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Abstract

This article focuses on the development reliability associated with one shot devices.

Item type: Article
ID code: 15454
Keywords: empirical bayes, fault tree, reliability, one-shot device, Risk Management
Subjects: Social Sciences > Industries. Land use. Labor > Risk Management
Department: Strathclyde Business School > Management Science
Related URLs:
Depositing user: Mrs Caroline Sisi
Date Deposited: 11 Feb 2010 16:42
Last modified: 04 Oct 2012 12:48
URI: http://strathprints.strath.ac.uk/id/eprint/15454

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