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Empirical bayes estimates of development reliability for one shot devices

Quigley, J.L. and Bedford, T.J. and Walls, L.A. (2009) Empirical bayes estimates of development reliability for one shot devices. Safety and Reliability : the journal of the Safety and Reliability Society, 29 (4). pp. 35-46. ISSN 0961-7353

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    This article describes a method for estimating the reliability of a system under development that is an evolution of previous designs. We present an approach to making effective use of heritage data from similar operational systems to estimate reliability of a design that is yet to realise any data. The approach also has a mechanism to adjust initial estimates in the light of sparse data that becomes available in early stages of test. While the estimation approach, known as empirical Bayes is generic, we focus on one shot devices as this was the type of system which provided the practical motivation for this work and for which we illustrate an application.

    Item type: Article
    ID code: 15454
    Keywords: empirical bayes, fault tree, reliability, one-shot device, Risk Management, Safety, Risk, Reliability and Quality
    Subjects: Social Sciences > Industries. Land use. Labor > Risk Management
    Department: Strathclyde Business School > Management Science
    Related URLs:
    Depositing user: Mrs Caroline Sisi
    Date Deposited: 11 Feb 2010 16:42
    Last modified: 31 Jul 2014 07:51

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