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Comparison of dark and light-induced annealing of metastable defects in a-Si:H

Gleskova, Helena and Nakata, M. and Wagner, S. (1994) Comparison of dark and light-induced annealing of metastable defects in a-Si:H. In: Amorphous silicon technology - 1994. MRS Symposium Proceedings, 336 . Materials Research Society, Warrendale, PA, pp. 245-250. ISBN 9781558992368

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Abstract

This chapter looks at a comparison of dark and light-induced annealing of metastable defects in a-Si:H

Item type: Book Section
ID code: 33441
Keywords: comparison, dark, light-induced annealing , metastable defects, a-Si:H, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 04 Nov 2011 16:30
    Last modified: 06 Sep 2014 07:14
    URI: http://strathprints.strath.ac.uk/id/eprint/33441

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