Molecular beam epitaxy as a method for the growth of free-standing bulk zinc-blende GaN and AlGaN crystals

Novikov, S.V. and Staddon, C.R. and Foxon, C.T. and Luckert, Franziska and Edwards, Paul and Martin, Robert and Kent, A.J. (2011) Molecular beam epitaxy as a method for the growth of free-standing bulk zinc-blende GaN and AlGaN crystals. Journal of Crystal Growth, 323 (1). pp. 80-83. ISSN 0022-0248 (https://doi.org/10.1016/j.jcrysgro.2010.10.125)

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Abstract

We have studied the growth of zinc-blende GaN and AlxGa1-xN layers, structures and bulk crystals by molecular beam epitaxy (MBE). MBE is normally regarded as an epitaxial technique for growth of very thin layers with monolayer control of their thickness. However, we have used the MBE technique for bulk crystal growth and have produced GaN layers up to 100 mu m in thickness. Thick, undoped, cubic GaN films were grown on semi-insulating GaAs (0 0 1) substrates by a modified plasma-assisted molecular beam epitaxy (PA-MBE) method and were removed from the GaAs substrate after the growth. The resulting free-standing GaN wafers may be used as substrates for further epitaxy of cubic GaN-based structures and devices. We have demonstrated that the PA-MBE process, we had developed, also allows us to achieve free-standing zinc-blende AlxGa1-xN wafers.

ORCID iDs

Novikov, S.V., Staddon, C.R., Foxon, C.T., Luckert, Franziska, Edwards, Paul ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, Martin, Robert ORCID logoORCID: https://orcid.org/0000-0002-6119-764X and Kent, A.J.;
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