Introduction - Journal of Microscopy

Trager-Cowan, C. and Wilkinson, A. (2008) Introduction - Journal of Microscopy. Journal of Microscopy, 230 (3). p. 405. ISSN 0022-2720 (https://doi.org/10.1111/j.1365-2818.2008.01990.x)

Full text not available in this repository.Request a copy

Abstract

This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland.

ORCID iDs

Trager-Cowan, C. ORCID logoORCID: https://orcid.org/0000-0001-8684-7410 and Wilkinson, A.;