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Conference or Workshop Item
Torrance, K. and Keenan, H.E. (2009) Characterization of arsenic-rich waste slurries generated during gallium arsenide wafer lapping and polishing. In: 2009 International Conference on Compound Semiconductor MANufacturing TECHnology, 2009-05-18 - 2009-05-21. (Unpublished)