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Frigo, Guglielmo and Feng, Zhiwang and Seferi, Yljon and Burt, Graeme; (2025) Evaluation of delay time in PMU prototypes for hardware-in-the-loop testing. In: 2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS). IEEE International Workshop on Applied Measurements for Power Systems (AMPS) . IEEE, ROM, pp. 1-6. ISBN 978-1-6654-7765-9
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Gallarreta, Alexander and Füser, Heiko and Seferi, Yljon and Öztürk, Tezgül C. and de la Vega, David and Stewart, Brian G. and Burt, Graeme; (2025) On the definition of power grid representative test waveforms for sample-by-sample uncertainty analysis. In: 15th IEEE International Workshop on Applied Measurements for Power Systems. 2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS) . IEEE, ROM, pp. 1-6. ISBN 978-1-6654-7765-9