Inter-pass peening for residual stress control in additive manufacturing : validation using ultrasonic, X-ray and contour method

Walker, Joseph and Mills, Brandon and Javadi, Yashar and MacLeod, Charles and Sun, Yongle and Ahmad, Bilal and Williams, Stewart and Ding, Jialuo and Tamimi, Saeed (2025) Inter-pass peening for residual stress control in additive manufacturing : validation using ultrasonic, X-ray and contour method. Materials & Design, 260. 115247. ISSN 0261-3069 (https://doi.org/10.1016/j.matdes.2025.115247)

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Abstract

In this study, round-robin experiments were carried out to evaluate the effectiveness of inter-pass peening as an in-process residual stress (RS) mitigation technique for Wire Arc Additive Manufacturing (WAAM) of Ti-6Al-4V components. A newly developed method, Phased Array Ultrasonics for Residual Stress Measurement (PAURS), was evaluated for its capability to accurately characterise residual stress distributions. To validate PAURS, two established techniques, X-ray Diffraction (XRD), a non-destructive method, and the Contour Method (CM), a destructive technique, were employed. PAURS, particularly when implemented with Full Matrix Capture (FMC), demonstrated enhanced accuracy through improved data redundancy and outlier rejection. Results from PAURS and XRD showed good qualitative agreement with finite element (FE) models derived from CM data, despite some quantitative differences. Inter-pass peening was found to significantly reduce tensile RS in the heat-affected zone, with performance comparable to post-process peening. These findings support the use of inter-pass peening as an effective in-process RS mitigation strategy and highlight the potential of PAURS as a reliable, non-destructive RS measurement method for WAAM Ti-6Al-4V components.

ORCID iDs

Walker, Joseph ORCID logoORCID: https://orcid.org/0009-0003-3027-8708, Mills, Brandon, Javadi, Yashar ORCID logoORCID: https://orcid.org/0000-0001-6003-7751, MacLeod, Charles ORCID logoORCID: https://orcid.org/0000-0003-4364-9769, Sun, Yongle, Ahmad, Bilal, Williams, Stewart, Ding, Jialuo and Tamimi, Saeed ORCID logoORCID: https://orcid.org/0000-0002-5450-0073;