X-ray crystal spectrometer throughput, data treatment, and configuration over the JET DTE2 and DTE3 campaigns

Patel, A. M. and Hawkes, N. C. and Zastrow, K.-D. and O’Mullane, M. (2025) X-ray crystal spectrometer throughput, data treatment, and configuration over the JET DTE2 and DTE3 campaigns. Review of Scientific Instruments, 96 (9). 093503. ISSN 1089-7623 (https://doi.org/10.1063/5.0274324)

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Abstract

The calibration of the JET x-ray spectrometer is presented. The absolute throughput, diffractor focusing, and instrument function of the spectrometer are presented, and the quality of the ion temperature measurement is re-assessed, particularly at the lower end. The addition of a second diffractor enables the simultaneous measurements of the spectra from H- and He-like nickel, which widens the spatial coverage of the core-ion temperature measurements for high-performance plasmas at a fixed Bragg angle range. A calculation of the absolute continua from the spectrum background from the second diffractor is analyzed for different JET plasmas. The spectrometer’s narrow bandwidth makes it ideal as an “x-ray monochromator” that can sample a single energy channel (or two over the two crystal orders) within the free–free and free–bound x-ray continua. The measurable effect for impurity-seeded plasmas is explored as a means to determine the plasma concentration of the seeding impurities, which has the potential to be a robust method for high performance DT operations in reactor-class machines.

ORCID iDs

Patel, A. M., Hawkes, N. C., Zastrow, K.-D. and O’Mullane, M. ORCID logoORCID: https://orcid.org/0000-0002-2160-4546;