On the definition of power grid representative test waveforms for sample-by-sample uncertainty analysis

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Gallarreta, Alexander and Füser, Heiko and Seferi, Yljon and Öztürk, Tezgül C. and de la Vega, David and Stewart, Brian G. and Burt, Graeme; (2025) On the definition of power grid representative test waveforms for sample-by-sample uncertainty analysis. In: 15th IEEE International Workshop on Applied Measurements for Power Systems. 2025 IEEE 15th International Workshop on Applied Measurements for Power Systems (AMPS) . IEEE, ROM, pp. 1-6. ISBN 978-1-6654-7765-9 (https://doi.org/10.1109/AMPS66841.2025.11219960)

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Abstract

Power electronic-based devices are well known for injecting conducted emissions into power grids. Among these emissions, impulsive disturbances with complex amplitude and temporal variations are particularly significant due to their potential to interfere with grid operation. However, the accurate characterization of such disturbances is often complicated by the limitations of measurement instruments, which may distort the signals due to their reception paths and digitization processes. This paper presents a methodology for synthesizing power representative impulsive waveforms that can be reproduced using quantum voltage standards, such as Josephson Arbitrary Waveform Synthesizers (JAWS). Two waveform synthesis techniques are proposed, combining mathematical modeling and Gaussian-based functions to replicate the characteristics of real-world conducted emissions. The methodology is applied to synthesize three representative impulsive waveforms previously measured in power grids. These synthetic waveforms are then compared to the measured waveforms to evaluate the goodness-of-fit and validate the accuracy of the synthesis process. The resulting test waveforms are shown to be useful for the characterization and benchmarking of commercial measurement instruments. By exposing these instruments to realistic and reproducible impulsive disturbances, their performance in capturing complex emissions can be rigorously assessed.

ORCID iDs

Gallarreta, Alexander, Füser, Heiko, Seferi, Yljon ORCID logoORCID: https://orcid.org/0000-0003-4082-1949, Öztürk, Tezgül C., de la Vega, David, Stewart, Brian G. ORCID logoORCID: https://orcid.org/0000-0001-8084-573X and Burt, Graeme ORCID logoORCID: https://orcid.org/0000-0002-0315-5919;
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