Diffraction grating characterisation for cold-atom experiments

McGilligan, J. P. and Griffin, P. F. and Riis, E. and Arnold, A. S. (2016) Diffraction grating characterisation for cold-atom experiments. Journal of the Optical Society of America B, 33 (6). pp. 1271-1277. ISSN 0740-3224 (https://doi.org/10.1364/JOSAB.33.001271)

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We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.


McGilligan, J. P. ORCID logoORCID: https://orcid.org/0000-0002-6514-9696, Griffin, P. F. ORCID logoORCID: https://orcid.org/0000-0002-0134-7554, Riis, E. ORCID logoORCID: https://orcid.org/0000-0002-3225-5302 and Arnold, A. S. ORCID logoORCID: https://orcid.org/0000-0001-7084-6958;