Diffraction grating characterisation for cold-atom experiments
McGilligan, J. P. and Griffin, P. F. and Riis, E. and Arnold, A. S. (2016) Diffraction grating characterisation for cold-atom experiments. Journal of the Optical Society of America B, 33 (6). pp. 1271-1277. ISSN 1520-8540 (https://doi.org/10.1364/JOSAB.33.001271)
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Abstract
We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.
ORCID iDs
McGilligan, J. P. ORCID: https://orcid.org/0000-0002-6514-9696, Griffin, P. F. ORCID: https://orcid.org/0000-0002-0134-7554, Riis, E. ORCID: https://orcid.org/0000-0002-3225-5302 and Arnold, A. S. ORCID: https://orcid.org/0000-0001-7084-6958;-
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Item type: Article ID code: 56599 Dates: DateEvent25 May 2016Published3 May 2016Published Online3 May 2016AcceptedNotes: © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited. Subjects: Science > Physics Department: Faculty of Science > Physics Depositing user: Pure Administrator Date deposited: 03 Jun 2016 15:51 Last modified: 01 Nov 2024 01:35 Related URLs: URI: https://strathprints.strath.ac.uk/id/eprint/56599