Computer aided inspection qualification

McNab, D. and McNab, A. and Potts, A. and Toft, M. and McDonald, J.; Thompson, D.O. and Chimenti, D.E., eds. (2002) Computer aided inspection qualification. In: Review of progress in quantitative nondestructive evaluation. AIP Conference Proceedings, 21a . American Institute of Physics, Melville, pp. 2005-2012. ISBN 073540061X (https://doi.org/10.1063/1.1473039)

Abstract

Inspection Qualification under the ENIQ methodology uses a Technical Justification as a key element in assuring the performance of the inspection. It combines a mixture of physical reasoning and modeling linked to limited experimental trial data from identified worst-case defects, but the qualification process is costly and time-consuming. This paper describes an investigation into providing an integrated set of intelligent software tools to aid the process of inspection qualification.

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• Item metadata

  Item type:	Book Section
  ID code:	39547
  Dates:	Date Event 2002 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	07 May 2012 09:13
  Last modified:	08 Apr 2024 12:55
  URI:	https://strathprints.strath.ac.uk/id/eprint/39547