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Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

Niewczas, P. and Dziuda, L. and Fusiek, G. and Willshire, A.J. and McDonald, J.R. and Thursby, G.J. and Harvey, D. and Michie, W.C. (2003) Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. IEEE Transactions on Instrumentation and Measurement, 52 (8). pp. 1092-1096. ISSN 0018-9456

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In this paper we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic Fabry-Perot interferometric (EFPI) sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation using an EFPI strain sensor.