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Growth mechanism, microstructure, EPMA and Raman studies of pulsed laser deposited Nd1-xBa2+xCu3O7-delta thin films

Palai, R and Romans, EJ and Martin, RW and Docherty, FT and Pegrum, CM (2005) Growth mechanism, microstructure, EPMA and Raman studies of pulsed laser deposited Nd1-xBa2+xCu3O7-delta thin films. Physica C: Superconductivity and its Applications, 424 (1-2). pp. 57-71. ISSN 0921-4534

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Superconducting thin films of Nd1-xBa2+xCu3O7-delta have been grown on single crystal SrTiO3 substrates by pulsed laser deposition (PLD) using an off-stoichiometric Nd0.97Ba2.03Cu3O6 (Ba-rich NBCO) target. The statistical methods of Experimental design and regression analysis were used to understand and optimise the growth mechanism. The structural properties of both the target and the films were investigated by X-ray diffraction (XRD). The surface morphology of the films was examined by atomic force microscopy (AFM) and scanning tunnelling microscopy (STM). Electron probe microanalysis (EPMA) using a scanning electron microscope equipped with wavelength-dispersive X-ray (WDX) spectrometers was used to carry out qualitative and quantitative analysis of both the target and films. Micro-Raman spectroscopy was used to study the oxygen sublattice vibrations of both the target and the films. (c) 2005 Elsevier B.V. All rights reserved.