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Number of items: 4.


Naresh-Kumar, G. and Bruckbauer, J. and Edwards, P. R. and Kraeusel, S. and Hourahine, B. and Martin, R. W. and Kappers, M. J. and Moram, M. A. and Lovelock, S. and Oliver, R. A. and Humphreys, C. J. and Trager-Cowan, C. (2014) Coincident electron channeling and cathodoluminescence studies of threading dislocations in GaN. Microscopy and Microanalysis, 20 (1). pp. 55-60. ISSN 1431-9276

Naresh Kumar, G. and Mauder, C and Wang, K.R. and Kraeusel, Simon and Bruckbauer, Jochen and Edwards, P. R. and Hourahine, Benjamin and Kalisch, H. and Vescan, A. and Giesen, C. and Heuken, M and Trampert, A. and Day, A.P. and Trager-Cowan, Carol (2013) Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope. Applied Physics Letters, 102 (14). ISSN 0003-6951

Rauch, Christian and Tuomisto, Filip and Vilalta-Clemente, Arantxa and Lacroix, Bertrand and Ruterana, Pierre and Kraeusel, Simon and Hourahine, Benjamin and Schaff, William J. (2012) Defect evolution and interplay in n-type InN. Applied Physics Letters, 100 (9). 091907. ISSN 0003-6951

Kraeusel, Simon and Hourahine, Benjamin (2012) Global search for stable screw dislocation cores in III-N semiconductors. Physica Status Solidi A, 209 (1). pp. 71-74. ISSN 1862-6300

This list was generated on Mon Sep 15 13:23:16 2014 BST.