Improved sectioning in a slit scanning confocal microscope

Poher, V. and Kennedy, G.T. and Manning, H.B. and Owen, D.M. and Zhang, H.X. and Gu, E. and French, P.M.W. and Dawson, M.D. and Neil, M.A.A. (2008) Improved sectioning in a slit scanning confocal microscope. Optics Letters, 33 (16). pp. 1813-1815. ISSN 0146-9592 (http://www.opticsinfobase.org/DirectPDFAccess/ACC5...)

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Abstract

We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.

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