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In-situ reflectometry based studies of lateral epitaxial overgrowth

Watson, I.M. and Kim, K.S. and Kim, H.S. and Liu, C. and Deatcher, C.J. and Girkin, J.M. and Dawson, M.D. and Edwards, P.R. and Trager-Cowan, C. and Martin, R.W. (2001) In-situ reflectometry based studies of lateral epitaxial overgrowth. In: UK Nitrides Consortium Meeting, 2001-09-01, Glasgow, United Kingdom. (Unpublished)

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Abstract

This paper covers in-situ reflectometry based studies of lateral epitaxial overgrowth. It was presented at the 2001 UK Nitrides consortium.

Item type: Conference or Workshop Item (Paper)
ID code: 9002
Notes: AHR
Keywords: in-situ reflectometry, reflectometry, lateral epitaxial overgrowth, Optics. Light
Subjects: Science > Physics > Optics. Light
Department: Faculty of Science > Institute of Photonics
Faculty of Science > Physics
Related URLs:
    Depositing user: Strathprints Administrator
    Date Deposited: 06 Nov 2009 11:25
    Last modified: 17 Jul 2013 15:08
    URI: http://strathprints.strath.ac.uk/id/eprint/9002

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