Mas'ud, Abdullahi Abubakar and Stewart, Brian G. and McMeekin, Scott G (2016) An investigative study into the sensitivity of different partial discharge φ-q-n pattern resolution sizes on statistical neural network pattern classification. Measurement, 92. pp. 497-507. ISSN 0263-2241
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This paper investigates the sensitivity of statistical fingerprints to different phase resolution (PR) and amplitude bins (AB) sizes of partial discharge (PD) φ-q-n (phase-amplitude-number) patterns. In particular, this paper compares the capability of the ensemble neural network (ENN) and the single neural network (SNN) in recognizing and distinguishing different resolution sizes of φ-q-n discharge patterns. The training fingerprints for both the SNN and ENN comprise statistical fingerprints from different φ-q-n measurements. The result shows that there exists statistical distinction for different PR and AB sizes on some of the statistical fingerprints. Additionally, the ENN and SNN outputs change depending on training and testing with different PR and AB sizes. Furthermore, the ENN appears to be more sensitive in recognizing and discriminating the resolution changes when compared with the SNN. Finally, the results are assessed for practical implementation in the power industry and benefits to practitioners in the field are highlighted.
|Keywords:||classification (of information), statistics, bin size, different resolutions, discharge patterns, ensemble neural network, pattern resolution, phase resolution, statistical neural networks, training and testing, partial discharges, Electrical engineering. Electronics Nuclear engineering, Electrical and Electronic Engineering|
|Subjects:||Technology > Electrical engineering. Electronics Nuclear engineering|
|Department:||Faculty of Engineering > Electronic and Electrical Engineering|
|Depositing user:||Pure Administrator|
|Date Deposited:||03 Nov 2016 16:54|
|Last modified:||24 Apr 2017 02:45|