Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

Ding, W. and Gorbach, A.V. and Wadsworth, W.J. and Knight, J.C. and Skryabin, D.V. and Strain, M.J. and Sorel, M. and De La Rue, R.M. (2011) Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. In: 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, 2011-05-22 - 2011-05-26. (https://doi.org/10.1109/CLEOE.2011.5943163)

Abstract

Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].

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• Item metadata

  Item type:	Conference or Workshop Item(Paper)
  ID code:	45253
  Dates:	Date Event 1 January 2011 Published
  Subjects:	Science > Physics Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Science > Physics > Institute of Photonics Faculty of Science > Physics
  Depositing user:	Pure Administrator
  Date deposited:	18 Oct 2013 13:07
  Last modified:	09 Apr 2024 05:50
  Related URLs:	Scopus publication
  URI:	https://strathprints.strath.ac.uk/id/eprint/45253