Marazzi, Marco and Giardini, Mario Ettore and Borghesi, Alessandro and Sassella, Adele and Alessandri, M. and Ferroni, G. (1997) Optical properties of polycrystalline silicon thin films deposited by single-wafer chemical vapor deposition. Thin Solid Films, 296. pp. 91-93. ISSN 0040-6090Full text not available in this repository. Request a copy from the Strathclyde author
The ellipsometric study of polycrystalline silicon films deposited using a single wafer rapid thermal chemical vapor deposition reactor under varying conditions of temperature and doping is presented. In particular, using spectroscopic ellipsometry in the visible spectral range, we determined the thickness of the films and the structural changes as a function of the deposition temperature. A different film structure, from amorphous to polycrystalline, has been found for the different deposition temperatures. A shift to lower values of the transition temperature which marks the structural change and a decrease in the deposition rate as the doping level is increased are observed. Moreover, from the ellipsometric results the optical functions of the different samples were evaluated.
|Keywords:||optical properties, doping, deposited by single-wafer chemical vapor deposition, polycrystalline , silicon thin films, single-wafer chemical , vapour deposition, Bioengineering, Biomedical Engineering|
|Subjects:||Technology > Engineering (General). Civil engineering (General) > Bioengineering|
|Department:||Faculty of Engineering > Biomedical Engineering|
|Depositing user:||Pure Administrator|
|Date Deposited:||25 Sep 2013 14:20|
|Last modified:||22 Mar 2017 12:55|