Gurney, William (1971) Contact effects in Gunn diodes. Electronics Letters, 7 (24). pp. 711-713. ISSN 0013-5194Full text not available in this repository. (Request a copy from the Strathclyde author)
This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ÃŸ.
|Keywords:||Gunn diodes , electrical contacts, semiconductor device testing, quantitative measure of contact quality, Electrical engineering. Electronics Nuclear engineering, Electrical and Electronic Engineering|
|Subjects:||Technology > Electrical engineering. Electronics Nuclear engineering|
|Department:||Faculty of Science > Mathematics and Statistics|
|Depositing user:||Pure Administrator|
|Date Deposited:||09 Oct 2012 09:59|
|Last modified:||27 May 2016 04:03|