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Contact effects in Gunn diodes

Gurney, William (1971) Contact effects in Gunn diodes. Electronics Letters, 7 (24). pp. 711-713. ISSN 0013-5194

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Abstract

This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ß.

Item type: Article
ID code: 41360
Keywords: Gunn diodes , electrical contacts, semiconductor device testing, quantitative measure of contact quality, Electrical engineering. Electronics Nuclear engineering, Electrical and Electronic Engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Science > Mathematics and Statistics
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 09 Oct 2012 10:59
    Last modified: 05 Sep 2014 17:54
    URI: http://strathprints.strath.ac.uk/id/eprint/41360

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