Picture of scraped petri dish

Scrape below the surface of Strathprints...

Explore world class Open Access research by researchers at the University of Strathclyde, a leading technological university.

Explore

Contact effects in Gunn diodes

Gurney, William (1971) Contact effects in Gunn diodes. Electronics Letters, 7 (24). pp. 711-713. ISSN 0013-5194

Full text not available in this repository. (Request a copy from the Strathclyde author)

Abstract

This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ß.