Gurney, William (1971) Contact effects in Gunn diodes. Electronics Letters, 7 (24). pp. 711-713. ISSN 0013-5194
Full text not available in this repository. (Request a copy from the Strathclyde author)Official URL: http://dx.doi.org/10.1049/el:19710488
Abstract
This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ß.
| Item type: | Article |
|---|---|
| ID code: | 41360 |
| Keywords: | Gunn diodes , electrical contacts, semiconductor device testing, quantitative measure of contact quality, Electrical engineering. Electronics Nuclear engineering |
| Subjects: | Technology > Electrical engineering. Electronics Nuclear engineering |
| Department: | Faculty of Science > Mathematics and Statistics |
| Related URLs: | |
| Depositing user: | Pure Administrator |
| Date Deposited: | 09 Oct 2012 10:59 |
| Last modified: | 09 Oct 2012 10:59 |
| URI: | http://strathprints.strath.ac.uk/id/eprint/41360 |
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