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High resolution, single shot emittance measurement of relativistic electrons from laser-driven accelerator

Manahan, Grace and Brunetti, Enrico and Shanks, Richard and Islam, Mohammad and Ersfeld, Bernhard and Anania, Maria Pia and Cipiccia, Silvia and Issac, Riju and Raj, Gaurav and Vieux, Gregory and Welsh, Gregor H. and Wiggins, Mark and Jaroszynski, Dino (2011) High resolution, single shot emittance measurement of relativistic electrons from laser-driven accelerator. In: Laser acceleration of electrons, protons, and ions and medical applications of laser-generated secondary sources of radiation and particles. Proceedings of SPIE . SPIE--The International Society for Optical Engineering., Bellingham. ISBN 9780819486691

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Abstract

The normalised transverse emittance is a measure of the quality of an electron beam from a particle accelerator. The brightness, parallelism and focusability are all functions of the emittance. Here we present a high-resolution single shot method of measuring the transverse emittance of a 125 +/- 3 MeV electron beam generated from a laser wakefield accelerator (LWFA) using a pepper-pot mask. An average normalised emittance of epsilon(rms,x,y) = 2.2 +/- 0.7, 2.3 +/- 0.6 pi-mm-mrad was measured, which is comparable to that of a conventional linear accelerator. The best measured emittance was epsilon(rms,x),= 1.1 +/- 0.1 pi-mm-mrad, corresponding to the resolution limit of our system. The low emittance indicates that this accelerator is suitable for driving a compact free electron laser.

Item type: Book Section
ID code: 40834
Keywords: high resolution, single shot emittance measurement , relativistic electrons , laser-driven accelerator , emittance , pepper-pot mask , laser wakefield acceleration, beams, Physics
Subjects: Science > Physics
Department: Faculty of Science > Physics
Technology and Innovation Centre > Advanced Science and Technology
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Depositing user: Pure Administrator
Date Deposited: 09 Aug 2012 14:25
Last modified: 06 Sep 2014 08:39
URI: http://strathprints.strath.ac.uk/id/eprint/40834

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