Validation of a procedure for translation of laboratory measurements on amorphous silicon devices to real operating conditions

Gottschalg, R. and Beyer, H.G and Jacobides, F. and Infield, D.G. (2001) Validation of a procedure for translation of laboratory measurements on amorphous silicon devices to real operating conditions. In: 17th European Photovoltaic Solar Energy Conference, 2001-10-01 - 2001-10-01.

Abstract

This paper looks at the validation of a procedure for translation of laboratory measurements on amorphous silicon devices to real operating conditions

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• Item metadata

  Item type:	Conference or Workshop Item(Paper)
  ID code:	39340
  Dates:	Date Event October 2001 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	24 Apr 2012 15:08
  Last modified:	09 Apr 2024 05:12
  URI:	https://strathprints.strath.ac.uk/id/eprint/39340