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The application of principal component analysis to study TSDC spectra

Given, M.J. and Fouracre, R.A. and Banford, H. (2003) The application of principal component analysis to study TSDC spectra. In: Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 2003-10-19 - 2003-10-22, Albuquerque.

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Abstract

The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

Item type: Conference or Workshop Item (Paper)
ID code: 39244
Keywords: application, principal component, analysis, study, tsdc spectra, aging , temperature , solids, principal component analysis, polyimides, inductors, history, dielectric measurements, current measurement , chemicals, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 18 Apr 2012 15:28
    Last modified: 06 Sep 2014 15:08
    URI: http://strathprints.strath.ac.uk/id/eprint/39244

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