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Testing analogue circuits with binary sequences : a feasibility study

Bekheit, M. and Hamilton, D.J. and Stimpson, B.P. (2002) Testing analogue circuits with binary sequences : a feasibility study. In: 8th IEEE International Mixed Signal Testing Workshop, 2002-01-01, Montreux.

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Abstract

This paper provides a feasibility study of testing analogue circuits with binary sequences

Item type: Conference or Workshop Item (Paper)
ID code: 38896
Keywords: testing, analogue circuits, binary sequences, feasibility study, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 03 Apr 2012 14:28
    Last modified: 17 Jul 2013 15:09
    URI: http://strathprints.strath.ac.uk/id/eprint/38896

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