Edwards, P.R. and Martin, R.W. and O'Donnell, K.P. and Watson, I.M. (2003) Simultaneous composition and cathodoluminescence spectral mapping of III-nitride structures. Microscopy of semiconducting materials (180). pp. 293-296. ISSN 1742-6596
Full text not available in this repository. (Request a copy from the Strathclyde author)Abstract
Gallium nitride based structures have been characterised using the novel approach of simultaneous wavelength-dispersive X-ray microanalysis and cathodoluminescence spectral mapping. Details are presented of the instrumentation developed to carry out such measurements. Application of the technique to MOVPE-grown indium gallium nitride epilayers shows microscopic variations in the indium content, which correlate directly with spatially-dependent shifts observed in the peak wavelength of the luminescence spectrum. Regions of higher indium content are shown to emit at lower energy, mirroring equivalent macroscopic observations
| Item type: | Article |
|---|---|
| ID code: | 37947 |
| Keywords: | microscopy, cathodoluminescence , spectral mapping, Physics |
| Subjects: | Science > Physics |
| Department: | Faculty of Science > Physics Faculty of Science > Institute of Photonics |
| Related URLs: | |
| Depositing user: | Pure Administrator |
| Date Deposited: | 27 Feb 2012 15:08 |
| Last modified: | 11 Jul 2012 11:34 |
| URI: | http://strathprints.strath.ac.uk/id/eprint/37947 |
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