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Bit pattern dependent effect reduction in all-optical 3R regeneration

Glesk, I. and Wang, B.C and Xu, L. and Zhou, Dujin and Runser, Robert J. and Prucnal, P.R. (2001) Bit pattern dependent effect reduction in all-optical 3R regeneration. In: 3rd Electronic Circuits and Systems Conference, 2001-09-05 - 2001-09-07, Bratislava.

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Abstract

This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration

Item type: Conference or Workshop Item (Paper)
ID code: 37595
Keywords: bit pattern, dependent effect, reduction, all-optical, 3r regeneration, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 11 Feb 2012 05:21
    Last modified: 04 Oct 2012 17:22
    URI: http://strathprints.strath.ac.uk/id/eprint/37595

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