Glesk, I. and Wang, B.C and Xu, L. and Zhou, Dujin and Runser, Robert J. and Prucnal, P.R. (2001) Bit pattern dependent effect reduction in all-optical 3R regeneration. In: 3rd Electronic Circuits and Systems Conference, 2001-09-05 - 2001-09-07, Bratislava.
Full text not available in this repository. (Request a copy from the Strathclyde author)Abstract
This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration
| Item type: | Conference or Workshop Item (Paper) |
|---|---|
| ID code: | 37595 |
| Keywords: | bit pattern, dependent effect, reduction, all-optical, 3r regeneration, Electrical engineering. Electronics Nuclear engineering |
| Subjects: | Technology > Electrical engineering. Electronics Nuclear engineering |
| Department: | Faculty of Engineering > Electronic and Electrical Engineering |
| Related URLs: | |
| Depositing user: | Pure Administrator |
| Date Deposited: | 11 Feb 2012 05:21 |
| Last modified: | 04 Oct 2012 17:22 |
| URI: | http://strathprints.strath.ac.uk/id/eprint/37595 |
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