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Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Pincik, E. and Kobayashi, H. and Jurecka, S. and Jergel, M. and Gleskova, H. and Takahashi, M. and Brunner, R. and Fujiwara, N. and Mullerova, J. (2004) Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. [Proceedings Paper]

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Abstract

This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Item type: Proceedings Paper
ID code: 33449
Keywords: investigation, electrical, structural, optical properties, very thin oxide, cyanide treatment, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Related URLs:
    Depositing user: Pure Administrator
    Date Deposited: 20 Jan 2012 09:48
    Last modified: 17 Jul 2013 13:52
    URI: http://strathprints.strath.ac.uk/id/eprint/33449

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