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Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Pincik, E. and Kobayashi, H. and Jurecka, S. and Jergel, M. and Gleskova, H. and Takahashi, M. and Brunner, R. and Fujiwara, N. and Mullerova, J. (2004) Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Proccedings of the fifth international conference on thin film physics and applications. SPIE--The International Society for Optical Engineering., Bellingham, WA, pp. 481-488. ISBN 9780819457554

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Abstract

This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment

Item type: Book Section
ID code: 33449
Keywords: investigation, electrical, structural, optical properties, very thin oxide, cyanide treatment, Electrical engineering. Electronics Nuclear engineering
Subjects: Technology > Electrical engineering. Electronics Nuclear engineering
Department: Faculty of Engineering > Electronic and Electrical Engineering
Depositing user: Pure Administrator
Date Deposited: 20 Jan 2012 09:48
Last modified: 21 May 2015 19:27
URI: http://strathprints.strath.ac.uk/id/eprint/33449

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