Pincik, E. and Kobayashi, H. and Jurecka, S. and Jergel, M. and Gleskova, H. and Takahashi, M. and Brunner, R. and Fujiwara, N. and Mullerova, J. (2004) Investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment. In: Proccedings of the fifth international conference on thin film physics and applications. 5th Int. Conf. On Thin Film Physics and Applications held in Shanghai, China, May 31 – June 2, 2004, 5774 . SPIE--The International Society for Optical Engineering., Bellingham, WA, pp. 481-488. ISBN 9780819457554
Full text not available in this repository. (Request a copy from the Strathclyde author)Abstract
This chapter looks at the investigation of electrical, structural, and optical properties of very thin oxide/a-Si:H/c-Si interfaces passivated by cyanide treatment
| Item type: | Book Section |
|---|---|
| ID code: | 33449 |
| Keywords: | investigation, electrical, structural, optical properties, very thin oxide, cyanide treatment, Electrical engineering. Electronics Nuclear engineering |
| Subjects: | Technology > Electrical engineering. Electronics Nuclear engineering |
| Department: | Faculty of Engineering > Electronic and Electrical Engineering |
| Related URLs: | |
| Depositing user: | Pure Administrator |
| Date Deposited: | 20 Jan 2012 09:48 |
| Last modified: | 04 Oct 2012 16:33 |
| URI: | http://strathprints.strath.ac.uk/id/eprint/33449 |
Actions (login required)
| View Item |